TI-MVX Ultrasonic Thickness Gauge with Enhanced Display Without Probe (Probe sold separately)
The new CHECK-LINE model TI-MVX offers a series of advanced features including A-Scan, B-Scan as well as a complete alphanumeric datalogging system with storage capacity of thousands of data values and A-scan captures. The TI-MVX features the highest resolution graphic LCD on the market and is especially engineered for optimal ease of use. It is supplied as a complete kit with all accessories in carrying case with FREE software, transfer cable and NIST-Traceable Calibration Certificate. Multi-function gauge with A & B scans and extensive datalogging (Price does not include a probe, which must be specified separately) Features The MVX is equipped with multiple viewing options to provide users with a complete set of inspection tools: (RF waveform, +/- Rectified waveform, Time based B-Scan, and Large Digits). The A-Scan rectified mode is commonly used for detecting flaws/pits in pulse-echo mode and measuring through paint and coatings in echo-echo mode. The time-based B-Scan feature of the MVX displays a cross section of the test material. It is commonly used to display the profile of the bottom surface of the test material. Built in hardware AGC gain control for through paint measurements in multi mode operation. The MVX has the ability to store 64 custom user defined setups. All factory setups can be selected, edited and saved to any setup location. CE Certified Use the visual alarm to set hi and lo limits for applications requiring specific tolerances. If the actual thickness value is above or below the limits, a red light is illuminated. Use the find feature to locate the detection point, while automatically adjusting the display to bring the signal into view. MVX also comes complete with our Windows® PC software for transferring data to and from a PC. Includes Flaw Inspection – Prove Up Mode, (special probe required) The high speed scan feature speeds up the inspection process by making 32 measurements per second. Remove transducer from the tesst material, and
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